X-Prep Vision

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Substrate Measurement Instrument

Mechanical Milling (?)

The X-Prep® Vision™ is a metrology tool that enables measurement of silicon and semitransparent substrates. It is necessary for applications that require uniform thinning to a specific target with a tolerance of +/- 3 µm or better. 

The X-Prep® fixture adapter is also secured to the motorized stage on the X-Prep® Vision™, ensuring the measurement/tool control coordinates remain aligned when transferred between systems.  

A library with over 130 materials (i.e., GaAs, InGaAs, SiC, Sapphire/Al2O3, InP, SiGe, GaN, photo-resist) is included with every system. 

Measurement & Observation – How it Works 

IR light is focused onto a sample, and a unique signal based on the refractive index of the material is created. The return signal is analyzed by the software to produce a thickness value. 

Measuring Below 10 µm Thickness 

For applications requiring thinning to less than 10 µm, precise measurement is possible only by adding the visible light spectrometer accessory. 

Features

  • Visible and IR (1310 nm) spectrometers for measuring from 20 nm to 1 mm 
  • Motorized, automatic X/Y/Z positioning for multipoint measurements 
  • Includes a material library with over 130 materials (i.e., GaAs, InGaAs, SiC, SiGe, etc.) for film stack measurements   
  • Stage adapter for X-Prep® fixtures that ensures accurate registration between systems 
  • Custom software to manage the mapping data of up to four (4) samples 

Video

Related Products

Equipment Accessories X-Prep vision

X-Prep® Vision™ Accessories

X-Prep® Vision Accessories™ include items for exclusive use with this instrument. 

Explore Accessories >

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Details

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Quick Slide Vice – can be positioned anywhere along the T-slots, and allow samples up to 3″ (76 mm) deep to be secured.

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Chamber Cleaning – simply adjust the valve to redirect coolant from the blade to the cleaning hose.

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Vertical Adjusting Clamp – can be positioned in any orientation throughout the T-slots in the tables.